Testing Services

MTECH Laboratories is equipped for component and device testing and evaluation services over a range of temperatures from 4.2 K (-269 °C) to 150 °C. Component and device testing includes:

Power MOSFETs, IGBTs, IGCTs, etc.:
  • On-state resistance (Ron)
  • Current-voltage (IV) curves
  • Breakdown voltages
  • Device characteristic parameters...
Power Diodes:
  • Current-voltage (IV) curves
  • Reverse-recovery times and charges (trr, Qrr)...
Capacitors:
  • Capacitance, dissipation factor, ESR, and ESL
  • Quality factor (Q)
  • Breakdown voltages and leakage current...
Low-Noise Amplifiers
Linear and Digital ICs
Magnets
Inductors (R, L, Q)
Resistors
Superconducting Networks
Power Systems (up to 150kWatts)

MTECH continues to develop a comprehensive catalogue of cryogenic electronic components qualified for low-temperature operation by MTECH's top-notch staff of engineers, physicists, and consulting engineers.